Universal palmtop X-ray fluorescence analyzer enables accurate coating thickness measurement and material analysis even in difficult and complex material combinations. Meet DIN ISO 3497 and ASTM B 568 standards
Weight 1.9kg
* Lasts 6 hours on a single battery charge
Measuring point: 3 mm
High resolution silicon drift detector
IP54 etc. for outdoor use *
Optional measuring box for table type equipment;
The full WinFTM software was used for data statistics
